scanning spectrometer

The scanning electron microscope provides information on chemical composition by use of X-ray spectrometer attachments.

扫描电子显微镜能利用x射线谱仪的附件来提供化学组份的信息.

The simulation of the Auger electron emissions in scanning probe electron energy spectrometer ( SPEES) is reported.

报道了对扫描探针电子能谱仪（SPEES）中俄歇电子出射的理论模拟研究。

X-ray diffraction, scanning electron microscopy, and energy dispersive spectrometer were used to characterize the final products, indicating the feasibility of our methods for synthesis of Pd/ MWNTs nanocomposite.

采用X射线衍射法、扫描电镜和能量色谱等对Pd/MWNTs纳米复合材料结构进行表征，结果表明本方法能高效地制备该复合材料。

The black abstract material which sticks to inside crack of the sample machined by wire-electrode cutting is analyzed and studied by using scanning electron microscope and X-ray energy spectrometer.

应用扫描电镜及X射线能谱仪等设备，对采用线切割制取的裂纹样品内表面的黑色不明物进行了分析。

We characterize the samples with X-ray diffractometer, scanning electron microscopes and EDS, and study the ultraviolet absorption of the samples with ultraviolet spectrometer.

并用x射线衍射仪、扫描电镜和能谱仪对样品进行了表征，用紫外分光光度计研究了样品的紫外吸收性能。